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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 49, Iss. 9 — Sep. 1, 1995
  • pp: 1279–1281

ATR/FT-IR Study of Vanadium Pentoxide Gel Films on Semiconductor Substrates

Nguyen Thi Be Bay, Pham Minh Tien, Simona Badilescu, Yahia Djaoued, G. Bader, Fernand E. Girouard, and Vo-Van Truong

Applied Spectroscopy, Vol. 49, Issue 9, pp. 1279-1281 (1995)


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Abstract

Deposition of the vanadium pentoxide on a KRS-5 ATR crystal by dip-coating has led to the formation of a thallium bronze. ATR spectroscopy is used to study the changes in the spectral pattern induced by the heat treatment of the films. The results show that both the spectrum of the xerogel and its evolution depend on the precursors and the method of preparation. The spectra of the heated thin films suggest an irreversible structural change taking place at a temperature around 220°C.

Citation
Nguyen Thi Be Bay, Pham Minh Tien, Simona Badilescu, Yahia Djaoued, G. Bader, Fernand E. Girouard, and Vo-Van Truong, "ATR/FT-IR Study of Vanadium Pentoxide Gel Films on Semiconductor Substrates," Appl. Spectrosc. 49, 1279-1281 (1995)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-49-9-1279

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