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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 66, Iss. 2 — Feb. 1, 2012
  • pp: 227–232

Femtosecond Stimulated Raman Spectroscopy Using a Scanning Multichannel Technique

J. REDDY CHALLA, YONG DU, and DAVID W McCAMANT

Applied Spectroscopy, Vol. 66, Issue 2, pp. 227-232 (2012)


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Abstract

A scanning multichannel technique (SMT) has been implemented in femtosecond stimulated Raman spectroscopy (FSRS). By combining several FSRS spectra detected at slightly different positions of the spectrograph via SMT, we have eliminated the systematic noise patterns (“fixed pattern noise”) due to the variation in sensitivity and noise characteristics of the individual charge-coupled device (CCD) pixels. In nonresonant FSRS, solvent subtraction can effectively remove the systematic noise pattern even without SMT. However, in the case of resonant FSRS, we show that a similar solvent subtraction procedure is ineffective at removing the noise patterns without SMT. Application of SMT results in averaged FSRS spectra with improved signal-to-noise ratios that approach the shot-noise limit.

Citation
J. REDDY CHALLA, YONG DU, and DAVID W McCAMANT, "Femtosecond Stimulated Raman Spectroscopy Using a Scanning Multichannel Technique," Appl. Spectrosc. 66, 227-232 (2012)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-66-2-227


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