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Applied Spectroscopy

Applied Spectroscopy

| PUBLISHED BY SAS — AVAILABLE FROM SAS AND OSA

  • Vol. 15, Iss. 1 — Jan. 1, 1961
  • pp: 10–13

Spectrographic Analysis of Hafnium By a Point-to-Plane Technique

R. C. Brayer, R. F. O'Connell, A. S. Powell, and R. H. Gale

Applied Spectroscopy, Vol. 15, Issue 1, pp. 10-13 (1961)


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Abstract

A method has been developed for the analysis of hafnium metal for aluminum, copper, iron, titanium, and tungsten in the ppm range and zirconium in the 1 0-4.0% range. Solid machined pieces 1 × 1 in. or larger are used. Spectra are excited with a low voltage ignited ac arc with low inductance and capacitance. Hafnium serves as the internal standard. The method offers an increase in speed and improved precision over the carrier distillation technique which has been commonly used.

Citation
R. C. Brayer, R. F. O'Connell, A. S. Powell, and R. H. Gale, "Spectrographic Analysis of Hafnium By a Point-to-Plane Technique," Appl. Spectrosc. 15, 10-13 (1961)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-15-1-10


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