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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 17, Iss. 6 — Nov. 1, 1963
  • pp: 160–163

Spectrographic Analysis of Tantalum and Tantalum Oxide

Roger D. Laib

Applied Spectroscopy, Vol. 17, Issue 6, pp. 160-163 (1963)


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Abstract

Tantalum metal is analyzed for 12 impurity elements by using a carrier distillation technique with a dc arc. The metal is oxidized in a muffle oven at 900°C. The oxide is mixed with a special carrier made of silver metal, silver chloride, and barium fluoride. A set of standards is included on each plate, and the analytical curves are linear for the concentration range used. The coefficient of variation varies from 3 0 to 8 7%.

Citation
Roger D. Laib, "Spectrographic Analysis of Tantalum and Tantalum Oxide," Appl. Spectrosc. 17, 160-163 (1963)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-17-6-160

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