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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 22, Iss. 5 — Sep. 1, 1968
  • pp: 520–526

Trace Organic Silicon Analysis Using Atomic Absorption Spectroscopy

Concetta M. Paralusz

Applied Spectroscopy, Vol. 22, Issue 5, pp. 520-526 (1968)


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Abstract

Trace silicon analysis in organic matrix materials is complicated by time-consuming concentration schemes and/or a lack of suitable organic standards. This paper describes an improved technique for quantitative determination of trace amounts of silicon in organic matrices. The method utilizes recent improvements in atomic absorption spectrometry and can be used to determine silicon in levels as low as 0.1 μg/ml in organic solution. Matrix interferences have been overcome by controlling solids of polymers and preparing standards using Si-free matrix materials. Suitable instrumentation and experimental conditions are described. Model organic silicon compounds and polydimethyl siloxane oils have been examined for use as standards. Experimental data, including a comparison of this method with wet-chemical and x-ray results, is presented. This method can be used for accurate determination of trace silicone contamination in the 1–10 ppm range in (1) paper products, (2) resinous and elastomeric polymers, and (3) oils.

Citation
Concetta M. Paralusz, "Trace Organic Silicon Analysis Using Atomic Absorption Spectroscopy," Appl. Spectrosc. 22, 520-526 (1968)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-22-5-520


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