Abstract

The use of a fundamental parameter method for effecting matrix corrections in quantitative x-ray spectrochemical analysis is described. A versatile computer program calculates composition directly from measured intensities. Variations in the basic approach are employed in the analysis of a series of sulfide and oxide samples. The Applied Research Laboratories multi-channel x-ray quantometer (MXQ) is briefly described.

Quasi-Monte Carlo method for calculating X-ray scatter in CT

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Soft x-ray radiation from laser-produced plasmas: characterization of radiation emission and its use in x-ray lithography

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Sampling, Mixing, and Grinding Techniques in the Preparation of Samples for Quantitative Analysis by X-Ray Diffraction and Spectrographic Methods*1

James W. Ballard, H. I. Oshry, and H. H. Schrenk
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Calculation of optical forces for arbitrary light beams using the Fourier ray method

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Calculation of the Kramers-Kronig transform of X-ray spectra by a piecewise Laurent polynomial method

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