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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 23, Iss. 4 — Jul. 1, 1969
  • pp: 346–348

Use of a Calculation Method for X-Ray Emission Analysis

A. Batt

Applied Spectroscopy, Vol. 23, Issue 4, pp. 346-348 (1969)


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Abstract

The use of a fundamental parameter method for effecting matrix corrections in quantitative x-ray spectrochemical analysis is described. A versatile computer program calculates composition directly from measured intensities. Variations in the basic approach are employed in the analysis of a series of sulfide and oxide samples. The Applied Research Laboratories multi-channel x-ray quantometer (MXQ) is briefly described.

Citation
A. Batt, "Use of a Calculation Method for X-Ray Emission Analysis," Appl. Spectrosc. 23, 346-348 (1969)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-23-4-346


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