Abstract

This note describes the extension of internal reflection spectroscopy into the far-infrared region below 150 cm⁻¹. To the best of our knowledge this is the first reported use of internal reflection techniques below 250 cm⁻¹, the cutoff point of the widely used KRS-5 reflector plate material.

Reflection Measurements on Reststrahlen Crystals in the Far-Infrared Region

Akiyoshi Mitsuishi, Yahiko Yamada, and Hiroshi Yoshinaga
J. Opt. Soc. Am. 52(1) 14-16 (1962)

Reflecting Power of Powders in the Far Infrared Region

Carroll W. Bryant
J. Opt. Soc. Am. 24(5) 139-142 (1934)

Infrared characterization of surfaces and coatings by internal-reflection spectroscopy

E. D. Palik, J. W. Gibson, R. T. Holm, M. Hass, M. Braunstein, and B. Garcia
Appl. Opt. 17(11) 1776-1785 (1978)

Polarizer for the Far-Infrared Region

Akiyoshi Mitsuishi, Yahiko yamada, Shigeru Fujita, and Hiroshi Yoshinaga
J. Opt. Soc. Am. 50(5) 433-436 (1960)

Refractive index of crystals from transmission and reflection measurements: MgO in the far-infrared region

S. Cunsolo, P. Dore, and C. P. Varsamis
Appl. Opt. 31(22) 4554-4558 (1992)