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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 24, Iss. 4 — Jul. 1, 1970
  • pp: 420–426

New Instrumental Techniques and Their Application to Electron Microprobe Analysis and Scanning Electron Microscopy

James P. Smith and Lee R. Reid

Applied Spectroscopy, Vol. 24, Issue 4, pp. 420-426 (1970)


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Abstract

This paper reviews several applications of new instrumentation which have been developed for the electron microprobe analyzer and the scanning electron microscope. By using signal modulation techniques and phase sensitive detection, the information from the scanning electron microscope is made more quantitative. Digital techniques applied to photomultiplier outputs allow more sensitive and quantitative measurements of cathodoluminescence intensities and secondary electron emission. The technique of pulse rate analysis is used to enhance the information contained in x-ray scanning micrographs from an electron microprobe analyzer. Several examples of these techniques are discussed.

Citation
James P. Smith and Lee R. Reid, "New Instrumental Techniques and Their Application to Electron Microprobe Analysis and Scanning Electron Microscopy," Appl. Spectrosc. 24, 420-426 (1970)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-24-4-420

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