Abstract

A dual-function plotter–printer terminal linked to a commercial time-share computer system was used to process electron microprobe soft x-ray spectral data and produce plots of soft x-ray spectra. This system is fast, highly reliable, and minimizes measurement time and errors. It provides the means of practical application of chemical combination effects on soft x-ray spectra to qualitative and quantitative electron microprobe analyses. The instrumentation and software operations are described, examples of plotted spectra are presented, and applications are shown.

Optical Diffractometer for Facilitation of X-Ray Diffraction Studies of Macromolecular Structures*

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J. Opt. Soc. Am. 47(12) 1061-1069 (1957)

Excitation of K-Shell Electrons in Be by Soft X Rays and 20-keV Electrons*

N. Swanson and K. Codling
J. Opt. Soc. Am. 58(9) 1192-1194 (1968)

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Richard D. Deslattes and Robert E. LaVilla
Appl. Opt. 6(1) 39-42 (1967)

Soft glass optical fiber characterization with X-ray computed microtomography

Maria C. Crocco, Fabio Mangini, Raffaele Filosa, Andrea Solano, Raffaele G. Agostino, Riccardo C. Barberi, Vincent Couderc, Mariusz Klimczak, Adam Filipkowski, Ryszard Buczynski, Stefan Wabnitz, Vincenzo Formoso, and Mario Ferraro
Opt. Mater. Express 14(1) 70-81 (2024)

Chemically amplified soft-x-ray resists: sensitivity, resolution, and molecular photodesorption

Glenn D. Kubiak, Robert Q. Hwang, Michelle T. Schulberg, Daniel A. Tichenor, and Kathleen Early
Appl. Opt. 32(34) 7036-7043 (1993)