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Applied Spectroscopy

Applied Spectroscopy


  • Vol. 29, Iss. 3 — May. 1, 1975
  • pp: 221–225

Application of the Rapid Scan Fourier Transform Infrared Spectrometer to Kinetics

J. O. Lephardt and G. Vilcins

Applied Spectroscopy, Vol. 29, Issue 3, pp. 221-225 (1975)

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The properties of a rapid scanning Fourier transform infrared spectrometer (FT-IR) which permit its effective utilization in acquiring kinetics information are described. Experiments which would be lengthy and difficult to perform by conventional infrared procedures can be performed quickly and more reliably with an FT-IR system. The detection of all spectral frequencies simultaneously, inherent to the interferometer spectrometer, enables these advances to be achieved. The computer, which is essential for Fourier transformation, can also be utilized to provide absorbance profiles, differential profiles, and other display formats which can simplify the analysis and improve the reliability of kinetic measurements. Spectra and profiles obtained for a gas-solid adsorption process and a gas phase reaction of butadiene with an NO2-N2O4 mixture are presented to illustrate the potentials of an FT-IR system.

J. O. Lephardt and G. Vilcins, "Application of the Rapid Scan Fourier Transform Infrared Spectrometer to Kinetics," Appl. Spectrosc. 29, 221-225 (1975)

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