Abstract

An argon plasma jet source of recent design is applied to multiple element spectrographic analysis of geological materials. The source is characterized in terms of accuracy of analysis and repeatability of measurements obtained from spectra from a large region of the plasma. Results of analyses for Al, Ca, Fe, Mg, Si, and Ti in geochemical reference samples, for Ti in lunar basalts, gabbros, and soils, and for the SiO₂/Al₂O₃ ratio in mordenite from geodes are presented. The effective temperature of the plasma region used for analytical measurements is 4670 ± 50°K. Use of control samples is recommended to improve accuracy of analysis.

A Method of Spectrographic Analysis of Impurities in Materials for Oxide Coating of Thermionic Cathodes*

T. J. Organ and S. L. Parsons
J. Opt. Soc. Am. 38(2) 191-195 (1948)

Elemental composition analysis of granite rocks using LIBS and LA-TOF-MS

Zeshan Adeel Umar, Nasar Ahmed, Rizwan Ahmed, Usman Liaqat, and Muhammad Aslam Baig
Appl. Opt. 57(18) 4985-4991 (2018)

The Spectrographic Analysis of Ferro-Silicon

J. H. Coulliette
J. Opt. Soc. Am. 37(8) 609-613 (1947)

Middle infrared multispectral aircraft scanner data: analysis for geological applications

Anne B. Kahle, Daryl P. Madura, and James M. Soha
Appl. Opt. 19(14) 2279-2290 (1980)

Comparison of two partial least squares-discriminant analysis algorithms for identifying geological samples with the ChemCam laser-induced breakdown spectroscopy instrument

Ann M. Ollila, Jeremie Lasue, Horton E. Newsom, Rosalie A. Multari, Roger C. Wiens, and Samuel M. Clegg
Appl. Opt. 51(7) B130-B142 (2012)