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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 29, Iss. 4 — Jul. 1, 1975
  • pp: 322–326

Integral Reflection Coefficient of X-ray Spectrometer Crystals

J. V. Gilfrich, D. B. Brown, and P. G. Burkhalter

Applied Spectroscopy, Vol. 29, Issue 4, pp. 322-326 (1975)


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Abstract

Analyzing crystals used in x-ray spectrometers have widely varying diffraction efficiencies. When employed in x-ray fluorescence analysis, the parameter which defines the efficiency is the integral reflection coefficient. This parameter has been measured using a single crystal spectrometer, as a function of wavelength, for a number of crystals commonly used. A recent adaptation of an existing diffraction theory is shown to make possible the calculation of integral reflection coefficients which agree with measured values.

Citation
J. V. Gilfrich, D. B. Brown, and P. G. Burkhalter, "Integral Reflection Coefficient of X-ray Spectrometer Crystals," Appl. Spectrosc. 29, 322-326 (1975)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-29-4-322


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