Abstract

Analyzing crystals used in x-ray spectrometers have widely varying diffraction efficiencies. When employed in x-ray fluorescence analysis, the parameter which defines the efficiency is the integral reflection coefficient. This parameter has been measured using a single crystal spectrometer, as a function of wavelength, for a number of crystals commonly used. A recent adaptation of an existing diffraction theory is shown to make possible the calculation of integral reflection coefficients which agree with measured values.

Conical Focusing Crystal Spectrometers for Cosmic X-Ray Astronomy

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I. Uschmann, U. Nothelle, E. Förster, V. Arkadiev, N. Langhoff, A. Antonov, I. Grigorieva, R. Steinkopf, and A. Gebhardt
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