Abstract

Ratios of the intensities of rotational Raman lines having the same initial state have been used to obtain a spectral sensitivity calibration of the optical system used to record those rotational lines. The advantages are that no "standard source" is required for the sensitivity calibration, and the "calibration source" by definition contains the correct polarization properties for the experimental situation.

Complete calibration of a Thomson scattering spectrometer system by rotational Raman scattering in H₂

Francesco Flora and Leonardo Giudicotti
Appl. Opt. 26(18) 4001-4008 (1987)

Polarization and Intensity Measurement in Raman Spectra by the Photoelectric Method

D. H. Rank
J. Opt. Soc. Am. 37(10) 798-803 (1947)

Rotational Raman scattering of hydrogen for calibrating a Thomson scattering device

Toshihiko Yamauchi and Ichiro Yanagisawa
Appl. Opt. 24(5) 700-709 (1985)

Intensity Relations in the Spectra of TitaniumII. Relative Intensities of the Stronger Multiplets of Ti I

George R. Harrison and Harry Engwicht
J. Opt. Soc. Am. 18(4) 287-301 (1929)

Robust calibration method for pure rotational Raman lidar temperature measurement

Hao Chen, Siying Chen, Yinchao Zhang, Pan Guo, He Chen, and Binglong Chen
Opt. Express 23(16) 21232-21242 (2015)