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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 30, Iss. 4 — May. 1, 1976
  • pp: 405–410

The Thickness Effect in X-ray Absorption Edges of Metals and Alloys

Douglas M. Pease

Applied Spectroscopy, Vol. 30, Issue 4, pp. 405-410 (1976)


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Abstract

The thickness effect is treated using a simplified form for the window function and the absorption edge. It is shown that for the low absorbing portion of the K edge the relative error caused by the tail of the window function becomes larger, rather than vanishing, in the limit of zero thickness foils. A means is described and experimentally demonstrated for separating changes in K absorption edge fine structure due to alloying from those due to the thickness effect.

Citation
Douglas M. Pease, "The Thickness Effect in X-ray Absorption Edges of Metals and Alloys," Appl. Spectrosc. 30, 405-410 (1976)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-30-4-405


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