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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 30,
  • Issue 4,
  • pp. 405-410
  • (1976)

The Thickness Effect in X-ray Absorption Edges of Metals and Alloys

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Abstract

The thickness effect is treated using a simplified form for the window function and the absorption edge. It is shown that for the low absorbing portion of the <i>K</i> edge the relative error caused by the tail of the window function becomes larger, rather than vanishing, in the limit of zero thickness foils. A means is described and experimentally demonstrated for separating changes in <i>K</i> absorption edge fine structure due to alloying from those due to the thickness effect.

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