Abstract

Thin samples in spectroscopy often show disturbing "channel spectra" due to interference fringes produced by reflections at the sample surface. These fringes will be characterized by a set of peak wavenumbers, <i>v_m</i> as <i>V</i>_m = <i>m</i>/2<i>nd</i> (1) where <i>m</i> = 0, 1, 2, ... ; <i>n</i> is the sample refractive index, and <i>d</i>, its thickness. The intensity of these peaks, Δ<i>T</i>, is given by Δ<i>T</i> = 4 (<i>n</i> − 1/<i>n</i> + 1)² (2) for thin film solid samples and Δ<i>T</i> = 4 (<i>n</i> − <i>n</i>₀/<i>n</i> + <i>n</i>₀)² (3) for samples contained between windows of index <i>n</i>₀.

Eliminating channel spectra in Fourier transform spectroscopy

David A. Naylor, Arvid A. Schultz, and T. Alan Clark
Appl. Opt. 27(12) 2603-2607 (1988)

Thin Film Infrared Channel Spectra

J. H. Shaw
Appl. Opt. 13(11) 2465-2467 (1974)

Multiple order spectra in Fourier transform infrared spectroscopy

Tomas Hirschfeld
Appl. Opt. 16(7) 1905-1907 (1977)

Polarization-dependent interference effects in grazing-angle Fourier transform infrared reflection–absorption spectroscopy to determine the thickness of water-ice films

Marin S. Robinson, Govind Mallick, Jennifer L. Spillman, Priscilla A. Carreon, and Stephanie Shalloo
Appl. Opt. 38(1) 91-95 (1999)

Cavity ringdown spectroscopy of thin films in the mid-infrared

George A. Marcus and H. Alan Schwettman
Appl. Opt. 41(24) 5167-5171 (2002)