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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 31, Iss. 6 — Nov. 1, 1977
  • pp: 528–530

Improved Sensitivity for in Situ Infrared Identification of Species Separated by Thin-Layer Chromatography using Programmed Multiple Development

Maria M. Gomez-Taylor and Peter R. Griffiths

Applied Spectroscopy, Vol. 31, Issue 6, pp. 528-530 (1977)


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Abstract

A method is described for measuring the infrared spectra of submicrogram quantities of materials separated by thin-layer chromatography (TLC) without removing the sample from the plate. The use of programmed multiple development for the chromatography concentrates each spot of sample on the TLC plate by approximately a factor of 4 compared to conventional TLC. A Fourier transform infrared spectrometer equipped with a mercury cadmium telluride detector enables recognizable spectra to be measured in less than 10 s.

Citation
Maria M. Gomez-Taylor and Peter R. Griffiths, "Improved Sensitivity for in Situ Infrared Identification of Species Separated by Thin-Layer Chromatography using Programmed Multiple Development," Appl. Spectrosc. 31, 528-530 (1977)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-31-6-528


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