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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 32,
  • Issue 1,
  • pp. 106-109
  • (1978)

The Quantitative Determination of Surface Oxide and Interfacial Metal Lost in Erbium Tritide Films

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Abstract

Thin film technology is important in many disciplines. A common problem encountered is the resulting purity of the deposited film. A contribution to this contamination is the interactions between the metal film and the substrates. Our particular interest is in erbium deuteride/tritide thin films, which are used for neutron generator targets.

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