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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 32,
  • Issue 1,
  • pp. 90-93
  • (1978)

Infrared Intensity Measurements by Band Contour Analysis

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Abstract

A spectroscopic band profile that can be used for asymmetric as well as for symmetric bands is proposed. The meaning of the asymmetry parameter is discussed, and the applications of this profile in infrared intensity determinations are examined.

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