Abstract

Reflection-absorption infrared spectroscopy and ellipsometry have been used to determine the structure of films formed by an epoxy resin adsorbed from solution onto polished iron and copper mirrors. Films only about 15 Å thick were obtained. The infrared spectra of these films were characterized by absorption bands near 1500 and 1240 cm⁻¹. Consideration of the thickness of the adsorbed films as well as wetability, surface coverage and the relative intensities of the bands near 1500 and 1240 cm⁻¹ indicates that the epoxy resin molecules are probably adsorbed with a vertical conformation where only a single oxirane oxygen atom is in contact with the surface.

Reflectivity of metallic films in the infrared

B. Carli
J. Opt. Soc. Am. 67(7) 908-910 (1977)

Application of thin-film interference coatings in infrared reflection spectroscopy of organic samples in contact with thin metal films

Martina Reithmeier and Andreas Erbe
Appl. Opt. 50(9) C301-C308 (2011)

Spectroscopic ellipsometry of metal phthalocyanine thin films

Aleksandra B. Djurišić, Chung Yin Kwong, Tsz Wai Lau, Zheng Tong Liu, Hoi Sing Kwok, Lillian Sze Man Lam, and Wai Kin Chan
Appl. Opt. 42(31) 6382-6387 (2003)

Infrared Reflectance of Evaporated Metal Films*

David M. Gates, Clyde C. Shaw, and Donald Beaumont
J. Opt. Soc. Am. 48(2) 88-89 (1958)

Infrared Absorption of Thin Metal Films

C. Hilsum
J. Opt. Soc. Am. 44(3) 188-191 (1954)