Abstract

A new scheme of densitometric data collection is described which comprises a digital filtering technique and process control program. A 6502-based PET 2001/32K microcomputer and an Elscan model 2500 specular microdensitometer are interfaced through the standard 6522 VIA port chip. An Analog Devices ADC80/12 monolithic A/D converter is used to digitize the analog output of the light photometering system. Additionally, control of the optical scanner assembly is provided through processor-driven 4-phase TTL logic circuitry. The technique applies to any analog signal of interest, either for filtering purposes or for recording directly into memory for later waveform or transient analysis. The maximum data gathering rate is 40 kHz, limited by the A/D conversion time of 25 μs.

Scanning Electron Microdensitometry

I. L. Kofsky, J. D. Geller, and C. S. Miller
Appl. Opt. 11(10) 2340-2346 (1972)

Linear Microdensitometry

D. N. Grimes
J. Opt. Soc. Am. 61(9) 1263-1263 (1971)

High-dynamic-range hybrid analog–digital control broadband optical spectral processor using micromirror and acousto-optic devices

Nabeel A. Riza and Syed Azer Reza
Opt. Lett. 33(11) 1222-1224 (2008)

Comments on: Experimental Demonstration of Coherence Effects and Linearity in Microdensitometry

Irving L Kofsky
Appl. Opt. 12(12) 2813-2813 (1973)

Experimental Demonstration of Coherence Effects and Linearity in Microdensitometry

George O. Reynolds and Albert E. Smith
Appl. Opt. 12(6) 1259-1270 (1973)