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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 38, Iss. 2 — Mar. 1, 1984
  • pp: 168–173

Application of Fourier Transform Infrared Emission Spectrometry to Surface Analysis

Y. Nagasawa and A. Ishitani

Applied Spectroscopy, Vol. 38, Issue 2, pp. 168-173 (1984)


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Abstract

Infrared emission spectra of thin polymer layers on flat aluminum plate have been measured using Fourier transform infrared spectrometry. The detection limit of Fourier transform infrared emission spectrometry (FT-IR-EMS) was found to be comparable with that of Fourier transform infrared reflection absorption spectrometry (FT-IR-RAS) when an emission ray was collected at a viewing angle of 70°. The merits of FT-IR-EMS over FT-IR-RAS were demonstrated in the measurement of nonflat surfaces. The residual lubricant on steel tire cords could be detected efficiently by the FT-IR-EMS mode. The linear relationship found between the relative emission intensity and the thickness of film represents the possibility for a quantitative analysis of a thin overlayer on metal surface.

Citation
Y. Nagasawa and A. Ishitani, "Application of Fourier Transform Infrared Emission Spectrometry to Surface Analysis," Appl. Spectrosc. 38, 168-173 (1984)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-38-2-168


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