Abstract

Polystyrene film has long been employed as convenient standard for the calibration of infrared spectrometers, especially in the <i>v</i>(CH) and fingerprint regions, because of its innumerable, strong, sharp, well-resolved peaks. Unfortunately, these films are not universally useful; in particular, there are no suitable calibration peaks around 2000 cm⁻¹, the nearest sharp peak being at 1601.4 cm⁻¹. The two phenyl overtone peaks at 1944.0 and 1801.6 cm⁻¹ are considered too broad to be useful. This situation is especially frustrating for organometallic chemists, who routinely monitor the infrared spectra of their compounds at ~2000 cm⁻¹, because these compounds invariably contain metal-CO groups (<i>v</i>(CO) 2150-1850 cm⁻¹). Also, many organometallics of interest contain metal-H and metal-CNR (R = alkyl or aryl) groups, again necessitating a suitable 2000 cm⁻¹ calibration peak, since both <i>v</i>(M-H) and <i>v</i>(CN) absorb near 2000 cm⁻¹. Gaseous CO and DCl are sometimes used as calibrants for, this region, but this entails the purchasing and handling of a fairly expensive and fragile gas cell. A better solution would be to have a readily available, cheap, rugged standard.

Ultrabroadband (>2000 cm⁻¹) multiplex coherent anti-Stokes Raman scattering spectroscopy using a subnanosecond supercontinuum light source

Masanari Okuno, Hideaki Kano, Philippe Leproux, Vincent Couderc, and Hiro-o Hamaguchi
Opt. Lett. 32(20) 3050-3052 (2007)

High-resolution far-infrared (20–350-cm⁻¹) spectra of several isotopic species of H₂O

J. W. C. Johns
J. Opt. Soc. Am. B 2(8) 1340-1354 (1985)

Calibrated 0.1-cm⁻¹ IR emission spectra from 80°N

J. R. Olson, J. Van Allen, P. F. Fogal, F. J. Murcray, and A. Goldman
Appl. Opt. 35(16) 2797-2801 (1996)

Calibration of far-infrared spectrometers in the 100–200-cm⁻¹ region with the ν₅–ν₄ band of acetylene

Doris B. Braund and A. R. H. Cole
Appl. Opt. 15(2) 419-422 (1976)

Infrared methane spectra between 1120 cm⁻¹ and 1800 cm⁻¹: a new atlas

R. D. Blatherwick, A. Goldman, B. L. Lutz, P. M. Silvaggio, and R. W. Boese
Appl. Opt. 18(22) 3798-3804 (1979)