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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 39, Iss. 2 — Mar. 1, 1985
  • pp: 211–214

Interferometric Detection of Near-Infrared Nonmetal Atomic Emission from a Microwave-Induced Plasma

J. E. Freeman and G. M. Hieftje

Applied Spectroscopy, Vol. 39, Issue 2, pp. 211-214 (1985)


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Abstract

A feasibility study has coupled a helium microwave-induced plasma (MIP) and a commercial Fourier transform infrared spectrometer for nonmetal determination. In the He MIP, compounds containing nonmetal atoms are fragmented and the resulting atoms excited. Strong nonmetal emission from such elements as C, N, and O then appears on a weak, relatively unstructured plasma background in the near-infrared region (800-2000 nm). Results are sufficiently promising that continuing studies are suggested, involving both dispersive and multiplex spectrometers.

Citation
J. E. Freeman and G. M. Hieftje, "Interferometric Detection of Near-Infrared Nonmetal Atomic Emission from a Microwave-Induced Plasma," Appl. Spectrosc. 39, 211-214 (1985)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-39-2-211


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