OSA's Digital Library

Applied Spectroscopy

Applied Spectroscopy

| PUBLISHED BY SAS — AVAILABLE FROM SAS AND OSA

  • Vol. 39, Iss. 2 — Mar. 1, 1985
  • pp: 311–316

Materials Characterization Using Factor Analysis of FT-IR Spectra. Part 2: Mathematical and Statistical Considerations

Peter M. Fredericks, James B. Lee, Paul R. Osborn, and Dom A. J. Swinkels

Applied Spectroscopy, Vol. 39, Issue 2, pp. 311-316 (1985)


View Full Text Article

Acrobat PDF (649 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

A method is described whereby the wealth of information present in the Fourier transform infrared spectrum of a material may be extracted and used to estimate useful properties of the material. Factor analysis is used to condense the data, after which the use of multiple linear regression allows correlations to be established for a calibration set, from which properties of unknown samples can be estimated.

Citation
Peter M. Fredericks, James B. Lee, Paul R. Osborn, and Dom A. J. Swinkels, "Materials Characterization Using Factor Analysis of FT-IR Spectra. Part 2: Mathematical and Statistical Considerations," Appl. Spectrosc. 39, 311-316 (1985)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-39-2-311


Sort:  Journal  |  Reset

References

References are not available for this paper.

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited