Abstract

A method for determining the optical properties (transmittance, reflectance, absorptance) with respect to thermal infrared radiation, and by extension of radiation from a number of other sources, is described and demonstrated by application to polymer films. A procedure for operation of the method on a Perkin Elmer 3600 Data Station interfaced to a Perkin Elmer 580B infrared spectrophotometer is described.

Thermal Expansion and Other Physical Properties of the Newer Infrared-Transmitting Optical Materials

Stanley S. Ballard and James Steve Browder
Appl. Opt. 5(12) 1873-1876 (1966)

Nonreciprocal optical properties of thermal radiation with SiC grating magneto-optical materials

Han Wang, Hao Wu, and Zhiyuan Shen
Opt. Express 25(16) 19609-19618 (2017)

Determination of the optical and thermal properties of semiconductors with the photothermal method

N. Yacoubi, A. Hafaiedh, and A. Joullié
Appl. Opt. 33(30) 7171-7174 (1994)

Surface-roughness effects on the determination of optical properties of materials by the reflection method

B. J. Stagg and T. T. Charalampopoulos
Appl. Opt. 30(28) 4113-4118 (1991)

Infrared Transmittance at High Temperature Using a Double-Beam Spectrophotometer

C. J. Parker and M. E. Nordberg
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