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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 39, Iss. 5 — Sep. 1, 1985
  • pp: 805–810

Measurement of Inductively Coupled Plasma Emission Spectra Using a Fourier Transform Spectrometer

E. A. Stubley and G. Horlick

Applied Spectroscopy, Vol. 39, Issue 5, pp. 805-810 (1985)


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Abstract

The qualitative and quantitative capabilities of a Fourier transform spectrometer (FTS) as a measurement system for atomic emission from the ICP are demonstrated. The spectral response of the interferometer from 193 nm to 650 nm is shown to be excellent. Quantitatively, detection limits measured by FTS are poorer by at least an order of magnitude than those obtained with a commercial direct reader-based ICP instrument. Factors affecting the quantitative performance of FTS—dynamic range limitations and the multiplex disadvantage—are discussed and a method to improve the quantitative capabilities of FTS is suggested.

Citation
E. A. Stubley and G. Horlick, "Measurement of Inductively Coupled Plasma Emission Spectra Using a Fourier Transform Spectrometer," Appl. Spectrosc. 39, 805-810 (1985)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-39-5-805

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