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  • Applied Spectroscopy
  • Vol. 39,
  • Issue 6,
  • pp. 1032-1035
  • (1985)

The ODD OVER EVEN Test for FT-IR Interferometers

David D. Saperstein and William G. Golden

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Abstract

Timing and intensity nonlinearities are highlighted with a new test for FT-IR instruments.

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