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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 40,
  • Issue 2,
  • pp. 272-273
  • (1986)

The Determination of S/N in an FT-IR Experiment and the Optimization of a Broad-Band HgCdTe Detector

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Abstract

One of the principal characteristics used to assess the performance of an infrared spectrometer is the signal-to-noise ratio (S/N). For optical null or ratio recording instruments, this amounts to measuring the noise on the 100% transmission line in a spectral region free of interferences. This method has been the common guideline used by the commercial suppliers of Fourier transform spectrometers in setting S/N specifications for systems to be delivered. However, Fourier transform spectroscopy, as it is usually practiced today, is a single-beam technique which has enjoyed rapid growth due in part to the inherent scanning accuracy and hence the ability to coadd interferograms or spectra to achieve increased S/N. There are a host of other advantages credited to interferometry because of the multiplexed nature of the method which are demonstrated in terms of S/N improvement.

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