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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 40, Iss. 3 — Mar. 1, 1986
  • pp: 291–297

Simultaneous Determination of C, H, N, O, F, Cl, Br, and S in Gas Chromatographic Effluent by Fourier Transform Red/Near-Infrared Atomic Emission Spectroscopy

Don E. Pivonka, William G. Fateley, and Robert C. Fry

Applied Spectroscopy, Vol. 40, Issue 3, pp. 291-297 (1986)


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Abstract

A high-powered, atmospheric-pressure, helium microwave-induced plasma (MIP) is used as the interface between a gas chromatograph (GC) and a Fourier transform near-infrared (FT-NIR) emission spectrometer. By the collection of a series of time-resolved interferograms when organic compounds elute from the GC into the plasma, a complete account of both spectral and chromatographic activity is recorded. Computer-generated, element-specific chromatographic reconstructions for each of eight different nonmetals are obtained from a single injection of a chemical mixture. Atomic emission intensity vs. chromatographic retention time is plotted for each of eight or more optical frequencies chosen from the 15,700-7900 cm−1 region. The frequencies are preselected to coincide with spectral lines of C, H, N, O, F, Cl, Br, and S emitting from the helium MIP. This unique GC/MIP/FT-NIR emission spectrometer provides simultaneous multielement-specific chromatographic detection of a variety of nonmetals important to synthetic organic chemistry.

Citation
Don E. Pivonka, William G. Fateley, and Robert C. Fry, "Simultaneous Determination of C, H, N, O, F, Cl, Br, and S in Gas Chromatographic Effluent by Fourier Transform Red/Near-Infrared Atomic Emission Spectroscopy," Appl. Spectrosc. 40, 291-297 (1986)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-40-3-291

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