A New Accessory for Infrared Emission Spectroscopy Measurements
Applied Spectroscopy, Vol. 40, Issue 3, pp. 401-405 (1986)
Acrobat PDF (467 KB)
Abstract
The principal problem in measurement of emission IR spectra is the low signal-to-noise ratio resulting from the large background radiation relative to sample emission. One method of increasing the signal is to collect the emitted radiation over a very large solid angle using an ellipsoidal mirror. In this method, placing the sample at the short focal length of the ellipsoid both increases the amount of radiation collected for an improved signal-to-noise ratio as well as facilitates sampling of small areas. For locating the area of interest, a microscope is mounted on the emission accessory. The results of testing this emission accessory under different operating conditions such as different samples, emission angles, temperatures, etc., are presented.
Citation
M. Handke and N. J. Harrick, "A New Accessory for Infrared Emission Spectroscopy Measurements," Appl. Spectrosc. 40, 401-405 (1986)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-40-3-401
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 