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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 40, Iss. 5 — Jul. 1, 1986
  • pp: 628–632

Advantages of Dual-Beam Interferometry in Fourier Transform Infrared Spectrometry

Donald L. Beduhn and Robert L. White

Applied Spectroscopy, Vol. 40, Issue 5, pp. 628-632 (1986)


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Abstract

A dual-beam Fourier transform infrared spectrometer (FT-IR) is described. Sensitivity improvement, photometric accuracy, and instrument stability are evaluated by comparing dual-beam spectra with conventional single-beam spectra. Dual-beam FT-IR data acquisitions require an order of magnitude less measurement time than single-beam acquisitions for spectra of comparable signal-to-noise ratios. Application of dual-beam FT-IR for analysis of a highly transmitting sample is discussed. Single fiber analysis without masking and without an infrared microscope is described.

Citation
Donald L. Beduhn and Robert L. White, "Advantages of Dual-Beam Interferometry in Fourier Transform Infrared Spectrometry," Appl. Spectrosc. 40, 628-632 (1986)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-40-5-628


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