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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 40, Iss. 5 — Jul. 1, 1986
  • pp: 700–704

Photothermal Deflection Densitometer with Pulsed-UV Laser Excitation

Fotios K. Fotiou and Michael D. Morris

Applied Spectroscopy, Vol. 40, Issue 5, pp. 700-704 (1986)


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Abstract

First application of pulsed photothermal deflection spectroscopy to solid samples is demonstrated. A new densitometer for thin layer chromatography based on this method is described. The technique is suitable for direct measurements in the ultraviolet region. A pulsed excimer laser is used to produce a transient thermal refractive index gradient. The laser delivers pulses of 1-2 mJ at 10-22 pulses/s, at 351 nm. With this system the detection limit for 2,4-dinitroaniline is 750 pg. The signal is linear with amount of analyte for about three orders of magnitude.

Citation
Fotios K. Fotiou and Michael D. Morris, "Photothermal Deflection Densitometer with Pulsed-UV Laser Excitation," Appl. Spectrosc. 40, 700-704 (1986)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-40-5-700

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