Abstract

First application of pulsed photothermal deflection spectroscopy to solid samples is demonstrated. A new densitometer for thin layer chromatography based on this method is described. The technique is suitable for direct measurements in the ultraviolet region. A pulsed excimer laser is used to produce a transient thermal refractive index gradient. The laser delivers pulses of 1-2 mJ at 10-22 pulses/s, at 351 nm. With this system the detection limit for 2,4-dinitroaniline is 750 pg. The signal is linear with amount of analyte for about three orders of magnitude.

Photothermal deflection spectroscopy and detection

W. B. Jackson, N. M. Amer, A. C. Boccara, and D. Fournier
Appl. Opt. 20(8) 1333-1344 (1981)

Accounting for absorption saturation effects in pulsed infrared laser-excited photothermal spectroscopy

Stephen E. Bialkowski
Appl. Opt. 32(18) 3177-3189 (1993)

Time-resolved, photothermal-deflection spectrometry with step optical excitation

Jianhua Zhao, Jun Shen, Cheng Hu, Jianqin Zhou, and Mauro Luciano Baesso
J. Opt. Soc. Am. B 21(5) 1065-1072 (2004)

Time-resolved, photothermal-deflection spectrometry with step optical excitation: experiments

Jianqin Zhou, Jianhua Zhao, Jun Shen, and Mauro Luciano Baesso
J. Opt. Soc. Am. B 22(11) 2409-2416 (2005)

Collinear photothermal deflection spectroscopy with light-scattering samples

Jonathan D. Spear, Richard E. Russo, and Robert J. Silva
Appl. Opt. 29(28) 4225-4234 (1990)