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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 40, Iss. 8 — Nov. 1, 1986
  • pp: 1079–1081

Interferometric Observation of Raman Spectra: Comparison of Photomultiplier and Avalanche Diode Detectors

D. J. Moffatt, H. Buijs, and W. F. Murphy

Applied Spectroscopy, Vol. 40, Issue 8, pp. 1079-1081 (1986)


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Abstract

The use of the technique of Fourier transform spectroscopy for the measurement of Raman scattering has recently been demonstrated; it was shown to be a viable method despite the absence of many of the advantages the FT measurement procedure has for infrared absorption spectra. Comparisons of the relative advantages of interferometry vs. dispersive spectroscopy for observing Raman spectra have been given previously. In our preliminary attempts to implement this technique on a Bomem DA3-02 spectrometer, several results were obtained which may be of interest to others contemplating such a step. In particular, we investigated the relative advantages of a photomultiplier and a silicon avalanche photodiode for detection of Raman spectra excited in two different spectral regions.

Citation
D. J. Moffatt, H. Buijs, and W. F. Murphy, "Interferometric Observation of Raman Spectra: Comparison of Photomultiplier and Avalanche Diode Detectors," Appl. Spectrosc. 40, 1079-1081 (1986)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-40-8-1079

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