Abstract

Electrothermal radiometry, a new radiometric technique for investigating phase transitions in semiconductors and metals, is described. Single crystals of (TaSe₄)₂I are heated by electric current pulses, and the thermal radiation of the samples is detected. The dependence of the electrothermal radiometry signal on the frequency and amplitude of the current pulses and on the temperature is discussed. The signal intensity is inversely proportional to the frequency. The static component of the temperature at the surface is obtained from the dependence on the current intensity. The temperature dependence is mostly determined by the change of the resistivity of the sample.

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