Analysis of the performance of a Fourier transform spectrometer with respect to source shot and flicker noises is presented. It was found that source shot noise uniformly distributes throughout the baseline, whereas source flicker noise remains localized about the generating spectral region(s).
Edward Voigtman and James D. Winefordner, "The Multiplex Disadvantage and Excess Low-Frequency Noise," Appl. Spectrosc. 41, 1182-1184 (1987)