Abstract

We report the first results obtained on a mid-IR FT spectrometer equipped with a polarizing Michelson interferometer (PMI), and the application examples of polarization spectroscopy are illustrated. A relatively simple method for conversion of a conventional instrument to PMI operation is designed. Specular reflection spectra of poly(vinyl acetate) film on copper and ATR spectra of a Langmuir-Blodgett film on silicon prism are presented.

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