Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 42,
  • Issue 8,
  • pp. 1466-1469
  • (1988)

Nondestructive Adhesive Analysis on Stamps by Fourier Transform Infrared Spectroscopy

Not Accessible

Your library or personal account may give you access

Abstract

Spectroscopy has long been a popular subject with respect to postal stamps, but analysis of postal stamps has been the subject of only a few spectroscopic studies. Fourier transform infrared techniques were used in developing a nondestructive technique to analyze the adhesives on the back of stamps. This factor is of importance since the value of a stamp is partially dependent on the conditions of the original adhesive. Diffuse reflectance was finally settled on as the method of choice for this analysis, and it shows great promise not only for stamp analysis but also for other types of documentation analysis as well.

PDF Article
More Like This
Analysis of aircraft exhausts with Fourier-transform infrared emission spectroscopy

Jörg Heland and Klaus Schäfer
Appl. Opt. 36(21) 4922-4931 (1997)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved