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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 42, Iss. 8 — Nov. 1, 1988
  • pp: 1538–1543

Deconvolution of Instrumental Broadening in Dispersive Raman Spectroscopy

K. H. Michaelian and W. I. Friesen

Applied Spectroscopy, Vol. 42, Issue 8, pp. 1538-1543 (1988)


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Abstract

The resolution enhancement of instrumentally broadened Raman spectra using neon emission lines as instrument functions is considered in this paper. When the signal-to-noise ratio is sufficiently high, Fourier deconvolution is effective in reducing the instrumental broadening to the optical limit, provided that the instrument function is narrower than the individual widths of the overlapping bands. If this is not the case, a nonlinear iterative technique is required. As an example, the v1 band of CCl4 has been measured at various slit widths and deconvolved with the appropriate neon lines; fór comparison, the computations have also been performed with Gaussian approximations to the true instrument functions.

Citation
K. H. Michaelian and W. I. Friesen, "Deconvolution of Instrumental Broadening in Dispersive Raman Spectroscopy," Appl. Spectrosc. 42, 1538-1543 (1988)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-42-8-1538


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