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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 42, Iss. 8 — Nov. 1, 1988
  • pp: 1563–1566

Fourier Transform Fluorescence Spectrometry

B. Hlivko, H. Hong, and R. R. Williams

Applied Spectroscopy, Vol. 42, Issue 8, pp. 1563-1566 (1988)


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Abstract

A variety of fluorescence spectra have been measured interferometrically, demonstrating the feasibility of Fourier Transform Fluorescence Spectrometry (FT-FS). Emission spectra have been measured with the use of a monochromatic source and an interferometer as the emission selector. Excitation spectra have been measured with the use of a multi-line laser. Fluorescence polarization spectra have also been recorded with the use of laser excitation. The analytical characteristics of working curves are discussed.

Citation
B. Hlivko, H. Hong, and R. R. Williams, "Fourier Transform Fluorescence Spectrometry," Appl. Spectrosc. 42, 1563-1566 (1988)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-42-8-1563

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