Abstract

A significant limitation to the use of the direct-current plasma (DCP), for sulfur analysis is the inability of the echelle spectrometer system to operate effectively at wavelengths below 190 nm. This difficulty arises because the spectrometer is not calibrated below 190 nm, and because the intensities of these short wavelengths are severely attenuated by the echelle's prism. For these reasons, the determination of sulfur, which has strong emission in the 180–183 nm region, is not routinely performed by DCP emission spectrometry.

Laser-induced plasma spectroscopy to as low as 130 nm when a gas-purged spectrograph and ICCD detection are used

Saara Kaski, Heikki Häkkänen, and Jouko Korppi-Tommola
Appl. Opt. 42(30) 6036-6039 (2003)

Simple compact monochromatic imaging system for plasma diagnostics

Rodney L. Williamson, Willard A. Hareland, and Henry C. Peebles
Appl. Opt. 28(12) 2201-2203 (1989)

Simple method for direct determination of bending strains by use of digital holography

Michael Y. Y. Hung, L. Lin, and Huai M. Shang
Appl. Opt. 40(25) 4514-4518 (2001)

Detection of the Gaseous Pollutant Sulfur Dioxide Using Current Tunable Pb₁₋x Snx Te Diode Lasers

G. A. Antcliffe and J. S. Wrobel
Appl. Opt. 11(7) 1548-1552 (1972)

Determination of Phosphorus and Sulfur in Fuel Rich Air–Hydrogen Flames

Augusta Syty and John A. Dean
Appl. Opt. 7(7) 1331-1336 (1968)