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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 43, Iss. 7 — Sep. 1, 1989
  • pp: 1252–1257

Semiquantitative Survey Capabilities of Inductively Coupled Plasma Mass Spectrometry

David Ekimoff, Ann Marie Van Norstrand, and David A. Mowers

Applied Spectroscopy, Vol. 43, Issue 7, pp. 1252-1257 (1989)


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Abstract

The capabilities of Inductively Coupled Plasma Mass Spectrometry for elemental survey analysis have been characterized. The analysis is a three-step process which involves collecting a spectrum from mass 5 to 240, deconvolving the spectrum into elemental constituents, and converting the elemental count rates to concentrations. The entire process takes less than 10 min per sample. Detection limits are generally less than 1 ng/mL, and the precision of 16 replicate analyses of a sample is between 5 and 20% for the majority of the elements detected. It was determined that the figures of merit for this analysis did not vary significantly as the matrix changed.

Citation
David Ekimoff, Ann Marie Van Norstrand, and David A. Mowers, "Semiquantitative Survey Capabilities of Inductively Coupled Plasma Mass Spectrometry," Appl. Spectrosc. 43, 1252-1257 (1989)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-43-7-1252

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