Abstract

A recursive algorithm independent of any functional peak shape is presented for determining optimal integration limits of spectral data from multiwavelength spectrometers. The resulting areas have significantly higher signal-to-noise ratios than the peak maxima. Signal-to-noise ratios are computed for synthetic data with both shot and white noise limitations. The algorithm is also applied to data from a Fourier transform spectrometer. For these data, integration of 25 adjacent spectral elements improves the signal-to-noise ratio as well as the signal averaging peak maxima from 25 successive spectra.

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