Abstract

A new reflectance accessory has been developed for the spectroscopic analysis of physically small samples and small areas of large samples. This accessory, known as the "Split Pea" accessory (SPA), has several advantages over those currently used for microsampling, i.e., high-pressure diamond cells, microscopes, and beam condensers. The SPA enables nondestructive, internal reflectance studies of microgram and nanogram samples with little or no sample preparation. Its specially configured pressure plate permits the application of high clamping pressures between the sample and the internal reflection element, simplifying the analysis of hard surface solids such as paint chips. The SPA can also be configured for either external or in-line diffuse reflectance, depending on the sample under investigation. The spectra presented here demonstrate the versatility and wide range of applications for this new accessory.

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