OSA's Digital Library

Applied Spectroscopy

Applied Spectroscopy

| PUBLISHED BY SAS — AVAILABLE FROM SAS AND OSA

  • Vol. 46, Iss. 1 — Jan. 1, 1992
  • pp: 111–125

The Spectropus™ System: Remote Sampling Accessories for Reflectance, Emission, and Transmission Analysis Using Fourier Transform Infrared Spectroscopy

G. L. Powell, M. Milosevic, J. Lucania, and N. J. Harrick

Applied Spectroscopy, Vol. 46, Issue 1, pp. 111-125 (1992)


View Full Text Article

Acrobat PDF (4566 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

The Spectropus™ system, a versatile optical sampling system for performing infrared spectroscopic analyses on remotely located samples with little regard to their size and with spectral quality and sampling rates comparable to, or better than, those achievable with spectrometer sample compartment accessories, is described. The Spectropus™ uses a "glass-tube beam-line" optical transfer system for delivering the collimated beam of an FT-IR spectrometer to one of several dedicated accessories, complete with its own detector, that may be located several meters distance from the spectrometer. The accessories include the barrel ellipsoid diffuse reflectance and emission accessory, the grazing-incidence external reflection accessory, and the gas analysis accessory. One system described here supports up to four accessories in laboratory air and another supports two accessories in two different glove boxes. Application examples include the monitoring of the formation of LiOH and LiOD on LiH and LiD in glove boxes as a result of moisture corrosion; the analysis of ink stains on paper; the analysis of inks, parylene films, and oil stains on metals; the analysis, with monolayer resolution, of oxides on aluminum foil and on uranium being oxidized in air; the analysis of wood and of graphite-epoxy composites, including the rapid sequential determination of diffuse reflectance and emission spectra from one point on one sample; and sub-part-per-million gas analyses using an evacuated cell reference spectrum that is free of pressurization stress artifacts.

Citation
G. L. Powell, M. Milosevic, J. Lucania, and N. J. Harrick, "The Spectropus™ System: Remote Sampling Accessories for Reflectance, Emission, and Transmission Analysis Using Fourier Transform Infrared Spectroscopy," Appl. Spectrosc. 46, 111-125 (1992)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-46-1-111


Sort:  Journal  |  Reset

References

References are not available for this paper.

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited