An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers
Applied Spectroscopy, Vol. 46, Issue 1, pp. 131-135 (1992)
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Abstract
The variable-exit-angle ultrasoft x-ray fluorescence technique has been evaluated for Ni/Fe thin-film multilayers. The theoretical and experimental agreement is reasonable. The experimental results demonstrate that on these Ni/Fe samples quantitative information can be obtained in the presence of surface contamination.
Citation
T. Scimeca and G. Andermann, "An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers," Appl. Spectrosc. 46, 131-135 (1992)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-46-1-131
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