The variable-exit-angle ultrasoft x-ray fluorescence technique has been evaluated for Ni/Fe thin-film multilayers. The theoretical and experimental agreement is reasonable. The experimental results demonstrate that on these Ni/Fe samples quantitative information can be obtained in the presence of surface contamination.
T. Scimeca and G. Andermann, "An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers," Appl. Spectrosc. 46, 131-135 (1992)