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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 46, Iss. 1 — Jan. 1, 1992
  • pp: 131–135

An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers

T. Scimeca and G. Andermann

Applied Spectroscopy, Vol. 46, Issue 1, pp. 131-135 (1992)


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Abstract

The variable-exit-angle ultrasoft x-ray fluorescence technique has been evaluated for Ni/Fe thin-film multilayers. The theoretical and experimental agreement is reasonable. The experimental results demonstrate that on these Ni/Fe samples quantitative information can be obtained in the presence of surface contamination.

Citation
T. Scimeca and G. Andermann, "An Evaluation of the Variable-Exit-Angle Ultrasoft X-Ray Fluorescence Technique as Applied to Ni/Fe Thin-Film Multilayers," Appl. Spectrosc. 46, 131-135 (1992)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-46-1-131


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