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Applied Spectroscopy

Applied Spectroscopy


  • Vol. 46, Iss. 1 — Jan. 1, 1992
  • pp: 88–92

Hyphenated On-the-Spot TG/FT-IR Technique

J. A. J. Jansen, J. H. Van Der Maas, and A. Posthuma De Boer

Applied Spectroscopy, Vol. 46, Issue 1, pp. 88-92 (1992)

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By the coupling of thermogravimetry (TG) and Fourier transform infrared spectroscopy (FT-IR), the thermal behavior of polymeric materials can be elucidated from their mass loss combined with characterization of the evolved components. A hyphenated TG/FT-IR technique is presented, which enables the direct detection and characterization of evolving components in TG experiments, i.e., without transferring these components from the TG to the FT-IR equipment. In this on-the-spot TG/FT-IR technique, the IR beam of the FT-IR spectrometer is led directly into the TG equipment. The IR beam is reflected by a mirror mounted inside the TG equipment and subsequently detected by a standard FT-IR detector. In this way, the evolved components are detected both in gas and condensed phase directly in the TG equipment. The detection limits are in the sub μg/s range. The experimental setup and conditions are presented together with advantages and applications in the field of polymeric research.

J. A. J. Jansen, J. H. Van Der Maas, and A. Posthuma De Boer, "Hyphenated On-the-Spot TG/FT-IR Technique," Appl. Spectrosc. 46, 88-92 (1992)

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