Abstract

Laser-excited atomic fluorescence spectrometry (LEAFS) can be an extremely sensitive method of trace analysis. However, some elements, such as As, have strong absorption lines only below 200 nm. Dye laser systems capable of resonance excitation of As are complicated and very expensive. By coincidence, a simple fixed-frequency argon fluoride (ArF) excimer laser produces a broad-band output centered at 193.0-193.2 nm overlapping the As absorption line at 193.7 nm. The use of an ArF excimer laser as a source for LEAFS detection of As in a H₂/air flame and an Ar-ICP has been evaluated. Detection limits of about 20 ng/mL were obtained with both atomizers. The limiting noise was laser-induced scatter in both cases. Methods of improving the detection powers are discussed.

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