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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 48,
  • Issue 10,
  • pp. 1289-1290
  • (1994)

On a Model Line Shape for Asymmetric Spectral Peaks

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Abstract

The handling of asymmetric spectral peaks has been a steady concern for scientists working in different fields (see Refs. 1 and 2 and references in Ref. 3). A recent paper introduced a new line shape to describe X-ray photoelectron peaks. In fact this line has been proposed from a purely phenomenological viewpoint, and there should be no reason to restrict its application to some particular field. Its properties suggest that it may be a useful tool for the analysis of spectroscopic data in general. Describing a peak by a simple mathematical function with a minimum number of parameters is an obvious advantage in curve fitting, and the possibility of using analytical expressions for different quantities utilized in spectroscopy is also a positive asset.

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