Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 48,
  • Issue 11,
  • pp. 1307-1315
  • (1994)

Influence of Solution-Deposited Anions on Glow Discharge Relative Ion Yields

Not Accessible

Your library or personal account may give you access

Abstract

When standard addition methods were employed for quantification in glow discharge mass spectrometry (GDMS), relative ion yields for some, but not all, elements were observed to be greater when deposited as a solution residue than as a corresponding solid of the same composition. The origin of these effects was investigated and determined to result from the deposition of anions present in the solution standards. The enhancements could be duplicated from a solid by pretreatment with a solution containing the anion. The mechanism by which the enhancements occur is not well understood, but we believe it involves a form of reactive etching followed by collisional dissociation of the sputtered molecular species into metal ions. Preliminary research suggests that it may be possible to compensate for changes in relative ion yield with solution treatment by employing an appropriate internal reference standard, or to match closely the matrices of the sample and standard in such a manner that quantification by standard addition is possible.

PDF Article
More Like This
Glow Discharge Resonance

A. B. Stewart
J. Opt. Soc. Am. 45(8) 651-657 (1955)

Abnormal glow discharge detection of visible radiation

N. S. Kopeika, J. Rosenbaum, and R. Kastner
Appl. Opt. 15(6) 1610-1615 (1976)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved