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Applied Spectroscopy

Applied Spectroscopy

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  • Vol. 50, Iss. 6 — Jun. 1, 1996
  • pp: 759–763

TO-LO Splitting in Infrared Spectra of Thin Films

Kiyoshi Yamamoto and Akio Masui

Applied Spectroscopy, Vol. 50, Issue 6, pp. 759-763 (1996)


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Abstract

The importance of transverse optic-longitudinal optic (TO-LO) splitting in the interpretation of infrared spectra of thin films is experimentally presented. When infrared spectra are observed at oblique angles of incidence, the shifts in peak position and/or the changes in peak shape may be due to TO-LO splitting. Before one assigns the optical behavior to surface phenomena such as molecular orientation, proper care must be employed. The proposed technique includes optical calculation to extract surface phenomena from TO-LO splitting in the spectra, and it is applied to reflection absorption spectra of perfluoropolyether.

Citation
Kiyoshi Yamamoto and Akio Masui, "TO-LO Splitting in Infrared Spectra of Thin Films," Appl. Spectrosc. 50, 759-763 (1996)
http://www.opticsinfobase.org/as/abstract.cfm?URI=as-50-6-759

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